Silicon Dioxide

illustrated graphic icon for silicon dioxide

Insulating substrates

Features

Identifying critical defects in silicon dioxide

Robust hardware

Nanotronics has designed configurations specific for use with substrate, epitaxy, and devices.

Identify micropits and slip lines

Analyzers tuned for precise classification of different defects.

Recommended Product

nSpecPS

The nSpec PS is highly flexible and detects defects in a variety of wafers, substrates, and materials.

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Automated optical inspection tool with robotic wafer loader, nSpec PSAutomated optical inspection tool with robotic wafer loader, nSpec PS
Benefits

Defect types

  • Stress-induced defects

    Easily identify stress defects from a difference in thermal expansion coefficients.

  • Metal contamination

    Identify metal contaminants from processing equipment or handling to prevent degraded device performance.

  • Bulk defects

    nSpec can detect crystalline defects in the bulk of the material.

Industries

Our solutions are tailored to meet the unique challenges and demands of each sector.

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Free sample report

Having trouble classifying critical defects? Nanotronics can help.
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