Gallium Antimonide

illustrated graphic icon for gallium antimonide

IR detectors


Identifying critical defects in gallium antimonide

Our AI provides solutions

Train a pipeline specific to your defects.

Identify micropits and slip lines

Analyzers tuned for precise classification of different defects.

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The nSpec PRISM offers a complete solution for compound semiconductor front-end wafer production, from unpolished substrates to epitaxy and device manufacturing.

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Automated optical inspection tool, nSpec PRISMAutomated optical inspection tool, nSpec PRISM

Defect types

  • Dislocations

    Detect defect types by shape and provide count, sizes, and locations for all defects such as edge dislocations and screw dislocations.

  • Lattice mismatch

    Easily identify lattice mismatch and thermal stress from a difference in thermal expansion coefficients.

  • Surface defects

    Surface imperfections can affect the quality of subsequent layers deposited on the wafer.


Our solutions are tailored to meet the unique challenges and demands of each sector.

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