Silicon

illustrated graphic icon for silicon

Microprocessors

Features

Identifying critical defects in silicon

Our AI provides solutions

Train a pipeline specific to your defects.

Identify micropits and basal plane defects

Analyzers tuned for precise classification of different defects.

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nSpecTURBO

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Benefits

Defect types

  • Crystalline dislocations

    Identify lattice mismatch to prevent imperfections in the growth process.

  • Scratches and micropits

    Surface imperfections can affect the quality of subsequent layers deposited on the wafer.

  • Bow and warp

    Measure bow and warp to ensure a perfectly flat surface before lithography and patterning processes.

  • Foreign material contamination

    Identify small particles from equipment or the environment during processing.

Epitaxy

Gallium Nitride on Silicon

Grow gallium nitride on silicon substrate.

Dislocations

On etched wafers, detect defect types by shape and provide counts, sizes, and locations for all defects, such as threading edge dislocations and threading screw dislocations.

V-pit or inverted pyramids

Identify defects that will cause voltage leaks.

Lattice mismatch

Easily identify lattice mismatch and thermal stress from a difference in thermal expansion coefficients.

Foreign material contamination

Identify small particles from equipment or the environment during processing.

Industries

Our solutions are tailored to meet the unique challenges and demands of each sector.

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