illustrated graphic icon for germanium

Power electronics


Identifying critical defects in germanium

Our AI provides solutions

Train a pipeline specific to your defects.

Identify micropits and slip lines

Analyzers tuned for precise classification of different defects.

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The nSpec PS is highly flexible and detects defects in a variety of wafers, substrates, and materials.

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Automated optical inspection tool with robotic wafer loader, nSpec PSAutomated optical inspection tool with robotic wafer loader, nSpec PS

Defect types

  • Metal contamination

    Identify metal contaminants from processing equipment or handling to prevent degraded device performance.

  • Surface roughness

    Determine surface roughness or haze to prevent non-uniform surfaces in subsequent processing steps.

  • Lattice mismatch

    Classify stacking faults on the atomic plane within the crystal lattice.

  • Pinholes

    Locate pinholes which can affect device reliability.


Our solutions are tailored to meet the unique challenges and demands of each sector.

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