Indium Phosphide

illustrated graphic icon for indium phosphide

Optoelectronics

Features

Identifying critical defects in indium phosphide

Golden template

nSpec generates a golden template to compare against scan images. To ignore feature boundaries, fiducial marks, and other regions, a mask is applied to the golden template.

Surface defects

Analyzers tuned for precise classification of different defects.

Benefits

nSpecCPS

The nSpec CPS is the ideal system for high-volume manufacturing environments.

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Automated optical inspection tool for high-volume manufacturing, nSpec CPSAutomated optical inspection tool for high-volume manufacturing, nSpec CPS
Benefits

Defect types

  • Surface defects

    Surface imperfections can affect the quality of subsequent layers deposited on the wafer.

  • Dislocations

    Detect defect types by shape and provide counts, sizes, and locations for all defects such as edge dislocations and screw dislocations.

Industries

Our solutions are tailored to meet the unique challenges and demands of each sector.

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