Graphene
Flexible electronics
Flexible electronics
Identifying critical defects in graphene
Autofocus
Advanced autofocus algorithms determine an autofocus map to deliver precise results across batches.
Handling
nSpec offers flexibility and can handle sample sizes ranging from 50 mm to 300 mm wafers.
Recommended Product
nSpecLS
Learn how the nSpec LS can efficiently increase yields in the lab and scale processes.
System highlights
Defect types
Fold defects
Folds in graphene are often formed during the transfer process and can affect the electronic properties of graphene by introducing strain.
Scroll defects
Scrolls can form during the transfer process when graphene experiences mechanical stress, or when there is a mismatch in thermal expansion coefficients between graphene and the substrate.
Foreign material contamination
Identify small particles from equipment or the environment during processing.
Surface roughness
Determine surface roughness or haze to prevent non-uniform surfaces in subsequent processing steps.