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Detect and classify defects using photoluminescence and fluorescence illumination.
Automatically inspect samples using visible and UV wavelengths.
Support for diverse sample types and flexible materials including microfluidics, Lab-on-a-Chip, and medical devices on wafers.
Quickly classify defects with nTelligence.
The nSpec PRISM is the ideal inspection system for life science applications with UV and IR illumination capabilities.