Insights
AI in Manufacturing: 10 Ways AI Is Changing the Manufacturing Industry
Photonic Devices
Automated inspection for complex photonic device layouts under high magnification.
Benefits
Maximize device yield
Optimize device yield calculations with fully customizable parameters, such as region of interest and defect class.
Pixel array inspection
Automatically detect defects in pixel arrays at high magnification.
Handle complex layouts
Handles device layouts with complex structures and unusual sizes with ease.
AI-powered defect classification
Quickly classify defects with nTelligence.
Recommended product
nSpecPS
The nSpec PS is highly flexible and detects defects in a variety of wafers, substrates, and materials.
System highlights
Max wafer size200 mm
Scan resolution0.9 µm/pixel (w/ 5x objective)
Industries
Our solutions are tailored to meet the unique challenges and demands of each sector.
Resources
More helpful resources from Nanotronics
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Insights
A Brief History of Automation in Manufacturing: Then and Now
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