Indium Gallium Arsenide

illustrated graphic icon for indium gallium arsenide

Power electronics


Identifying critical defects in indium gallium arsenide

Our AI provides solutions

Train a pipeline specific to your defects.


Advanced autofocus algorithms determine an autofocus map to deliver precise results across batches.

Recommended Product


The nSpec PRISM offers a complete solution for compound semiconductor front-end wafer production, from unpolished substrates to epitaxy and device manufacturing.

Learn more
Automated optical inspection tool, nSpec PRISMAutomated optical inspection tool, nSpec PRISM

Defect types

  • Crystalline defects

    nSpec can detect stacking faults and other crystalline defects in the bulk of the material.

  • Dislocations

    Detect defect types by shape and provide counts, sizes, and locations for all defects, such as edge dislocations and screw dislocations.

  • Surface roughness

    Determine surface roughness or haze to prevent non-uniform surfaces in subsequent processing steps.


Our solutions are tailored to meet the unique challenges and demands of each sector.

Contact Us

Get in touch with one of our industry experts.

Let's talk logistics.

Let’s talk about how Nanotronics can transform your manufacturing process.
Contact Us

Free sample report

Having trouble classifying critical defects? Nanotronics can help.
Get Sample Report