Indium Gallium Arsenide

illustrated graphic icon for indium gallium arsenide

Power electronics

Features

Identifying critical defects in indium gallium arsenide

Our AI provides solutions

Train a pipeline specific to your defects.

Autofocus

Advanced autofocus algorithms determine an autofocus map to deliver precise results across batches.

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nSpecPRISM

The nSpec PRISM offers a complete solution for compound semiconductor front-end wafer production, from unpolished substrates to epitaxy and device manufacturing.

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Automated optical inspection tool, nSpec PRISMAutomated optical inspection tool, nSpec PRISM
Benefits

Defect types

  • Crystalline defects

    nSpec can detect stacking faults and other crystalline defects in the bulk of the material.

  • Dislocations

    Detect defect types by shape and provide counts, sizes, and locations for all defects, such as edge dislocations and screw dislocations.

  • Surface roughness

    Determine surface roughness or haze to prevent non-uniform surfaces in subsequent processing steps.

Industries

Our solutions are tailored to meet the unique challenges and demands of each sector.

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