Indium Arsenide

illustrated graphic icon for indium arsenide

High speed transistors


Identifying critical defects in indium arsenide

Our AI provides solutions

Train a pipeline specific to your defects.


Advanced autofocus algorithms determine an autofocus map to deliver precise results across batches.

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The nSpec PS is highly flexible and detects defects in a variety of wafers, substrates, and materials.

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Automated optical inspection tool with robotic wafer loader, nSpec PSAutomated optical inspection tool with robotic wafer loader, nSpec PS

Defect types

  • Dislocations

    Detect defect types by shape and provide counts, sizes, and locations for all defects such as edge dislocations and screw dislocations.

  • Surface defects

    Surface imperfections can affect the quality of subsequent layers deposited on the wafer.

  • Surface roughness

    Determine surface roughness or haze to prevent non-uniform surfaces in subsequent processing steps.


Our solutions are tailored to meet the unique challenges and demands of each sector.

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