Patterned Wafers

Perform powerful device inspections on single patterned wafers with complexities ranging from multiple devices to non-repeating device layouts

Benefits

Boost device yield

Find and address defect excursions at every step of the manufacturing process.

Automatic defect detection

Detect subtle defects using golden template-based machine vision methods.

AI-powered defect classification

Quickly classify defects with nTelligence.

Device yield

Maximize device yield calculations with fully customizable parameters like region of interest and defect class.

Recommended Product

nSpecPS

The nSpec PS is highly flexible and detects defects in a variety of wafers, substrates, and materials

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Automated optical inspection tool with robotic wafer loader, nSpec PSAutomated optical inspection tool with robotic wafer loader, nSpec PS
Industries

Our solutions are tailored to meet the unique challenges and demands of each sector.

Resources

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Insights

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Free sample report

Having trouble classifying critical defects? Nanotronics can help.
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