Substrate Wafers

Perform rapid, full-sample defect detection and classification on substrate wafers.

Benefits

Identify device-killing defects early

Detect and classify crystal defects in substrate wafers with cross-polarized transmitted light.

Maximize yield

Find device-killing defects in bare wafers prior to lithography and optimize future product layouts to maximize device yield.

Surface scattering analysis

Quickly analyze and measure subtle topographical features like surface roughness and haze.

Edge inspection

Detect bevel defects, as well as edge chips and cracks, with wafer inspection that scans to the edges.

Recommended Product

nSpecPS

The nSpec PS is highly flexible and detects defects in a variety of wafers, substrates, and materials.

Learn more
Automated optical inspection tool with robotic wafer loader, nSpec PSAutomated optical inspection tool with robotic wafer loader, nSpec PS
Industries

Our solutions are tailored to meet the unique challenges and demands of each sector.

Resources

More helpful resources from Nanotronics

Insights

Explained: The Inspection Process in Manufacturing

Read More
inspect dimension metal parts by CMM after machining process in industrial factoryinspect dimension metal parts by CMM after machining process in industrial factory
Insights

Is Artificial Intelligence Cost-Effective? 16 Ways AI Helps Companies Save Money

Read More
Overhead view of three coworkers, two men and one woman, at an office table going over blueprints and plansOverhead view of three coworkers, two men and one woman, at an office table going over blueprints and plans
Contact Us

Get in touch with one of our industry experts.

Let's talk logistics.

Let’s talk about how Nanotronics can transform your manufacturing process.
Contact Us

Free sample report

Having trouble classifying critical defects? Nanotronics can help.
Get Sample Report